发明名称 |
GROUP III-V SUBSTRATE MATERIAL WITH THIN BUFFER LAYER AND METHODS OF MAKING |
摘要 |
A substrate comprises a Group III-V material having an upper surface and a buffer layer having a thickness of not greater than about 1.3 μm and overlying the upper surface of the substrate. A plurality of optoelectronic devices formed on the substrate having a normalized light emission wavelength standard deviation of not greater than about 0.0641 nm/cm2 at a wavelength within a range of between about 400 nm to about 550 nm. |
申请公布号 |
US2014185639(A1) |
申请公布日期 |
2014.07.03 |
申请号 |
US201314142266 |
申请日期 |
2013.12.27 |
申请人 |
Saint-Gobain Cristaux Et Detecteurs |
发明人 |
Faurie Jean-Pierre;Beaumont Bernard |
分类号 |
H01L33/32;H01S5/30 |
主分类号 |
H01L33/32 |
代理机构 |
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代理人 |
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主权项 |
1. A substrate comprising:
a body comprising a Group III-V material and having an upper surface; and a buffer layer comprising a Group III-V material adjacent the upper surface of the body,
wherein the buffer layer has an average thickness within a range of between at least about 0.01 μm to not greater than about 1.3 μm. |
地址 |
Courbevoie FR |