发明名称 CMOS CIRCUIT AND METHOD FOR FABRICATING THE SAME
摘要 A semiconductor device includes a semiconductor substrate and a gate insulation layer formed over the semiconductor substrate. A gate electrode is formed over the gate insulation layer. The gate electrode includes a silicon-containing electrode including a dopant, a capturing material to capture the dopant, and an activation control material to control an activation of the dopant.
申请公布号 US2014183650(A1) 申请公布日期 2014.07.03
申请号 US201313845184 申请日期 2013.03.18
申请人 SK HYNIX INC. 发明人 ROUH Kyong-Bong;NA Shang-Koon;LEE Mi-Ri;LEE Hun-Sung
分类号 H01L29/49 主分类号 H01L29/49
代理机构 代理人
主权项 1. A semiconductor device, comprising: a semiconductor substrate; a gate insulation layer formed over the semiconductor substrate; a gate electrode formed over the gate insulation layer, the gate electrode including a silicon-containing electrode including a dopant, a capturing material to capture the dopant, and an activation control material to control an activation of the dopant.
地址 Gyeonggi-do KR