发明名称 |
CMOS CIRCUIT AND METHOD FOR FABRICATING THE SAME |
摘要 |
A semiconductor device includes a semiconductor substrate and a gate insulation layer formed over the semiconductor substrate. A gate electrode is formed over the gate insulation layer. The gate electrode includes a silicon-containing electrode including a dopant, a capturing material to capture the dopant, and an activation control material to control an activation of the dopant. |
申请公布号 |
US2014183650(A1) |
申请公布日期 |
2014.07.03 |
申请号 |
US201313845184 |
申请日期 |
2013.03.18 |
申请人 |
SK HYNIX INC. |
发明人 |
ROUH Kyong-Bong;NA Shang-Koon;LEE Mi-Ri;LEE Hun-Sung |
分类号 |
H01L29/49 |
主分类号 |
H01L29/49 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a semiconductor substrate; a gate insulation layer formed over the semiconductor substrate; a gate electrode formed over the gate insulation layer, the gate electrode including a silicon-containing electrode including a dopant, a capturing material to capture the dopant, and an activation control material to control an activation of the dopant. |
地址 |
Gyeonggi-do KR |