发明名称 |
SUBSTRATE CLEANING APPARATUS |
摘要 |
A substrate cleaning apparatus cleans a surface of a substrate in a non-contact state. The substrate cleaning apparatus includes a substrate holding mechanism configured to hold and rotate the substrate, a two-fluid nozzle configured to jet a two-fluid jet flow, comprising a gas and a liquid, downwardly toward the front surface of the substrate held by the substrate holding mechanism, and a moving mechanism configured to move the two-fluid nozzle in one direction from a central portion toward a radially outer side of the substrate held by the substrate holding mechanism. The two-fluid nozzle is inclined so that an angle between an ejection center line of the two-fluid jet flow jetted from the two-fluid nozzle and a vertical line becomes a certain inclined angle, and the two-fluid jet flow collides with the front surface of the substrate at a forward position in a moving direction of the two-fluid nozzle. |
申请公布号 |
US2014182634(A1) |
申请公布日期 |
2014.07.03 |
申请号 |
US201314139685 |
申请日期 |
2013.12.23 |
申请人 |
EBARA CORPORATION |
发明人 |
ISHIBASHI Tomoatsu |
分类号 |
B08B3/02 |
主分类号 |
B08B3/02 |
代理机构 |
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代理人 |
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主权项 |
1. A substrate cleaning apparatus for cleaning a substrate having a front surface and a reverse surface, said substrate cleaning apparatus comprising:
a substrate holding mechanism configured to hold and rotate the substrate, with the front surface facing upward; a two-fluid nozzle configured to jet a two-fluid jet flow, comprising a gas and a liquid, downwardly toward the front surface of the substrate held by said substrate holding mechanism; and a moving mechanism configured to move said two-fluid nozzle in one direction from a central portion toward a radially outer side of the substrate held by said substrate holding mechanism; wherein said two-fluid nozzle is arranged to be inclined so that an angle between an ejection center line of the two-fluid jet flow jetted from said two-fluid nozzle and a vertical line becomes an inclined angle α, and the two-fluid jet flow collides with the front surface of the substrate at a forward position in a moving direction of said two-fluid nozzle. |
地址 |
Tokyo JP |