| 发明名称 |
Hierarchical, Distributed Built-in Self-Repair Solution |
| 摘要 |
A built-in self-test (BIST) circuit to test one or more memory blocks on an integrated circuit. The one or more memory blocks further includes a first memory block and a second memory block A built-in soft-repair controller (BISoR) is provided to soft repair the one or more memory blocks. The BIST circuit in conjunction with the BISoR is configured to test and soft repair the first memory block before performing test and soft repair of the second memory block. |
| 申请公布号 |
US2014189450(A1) |
申请公布日期 |
2014.07.03 |
| 申请号 |
US201314108489 |
申请日期 |
2013.12.17 |
| 申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
Varadarajan Devanathan;KS Raghavendra Prasad;Ellur Harsharaj |
| 分类号 |
G11C29/12 |
主分类号 |
G11C29/12 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An integrated circuit comprising:
one or more memory blocks; a built-in self-test (BIST) circuit configured to test one or more memory blocks, the one or more memory blocks having a first memory block and a second memory block; a built-in soft-repair controller (BISoR) configured to soft repair the one or more memory blocks; and the built-in self-test circuit in conjunction with the built-in soft-repair controller configured to test and soft repair the first memory block before performing test and soft repair of the second memory block. |
| 地址 |
Dallas TX US |
