NON-CONTACT MEASURING METHOD AND APPARATUS OF SEEBECK COEFFICIENT

摘要

The present invention relates to a method and an apparatus for measuring a non-contact seebeck coefficient of a thermoelectric material and, more specifically, to a method and an apparatus for measuring a non-contact seebeck coefficient, capable of measuring a precise seebeck coefficient of a thin film having a thickness thinner than one micrometer through a non-contact temperature measurement.