发明名称 Methods of characterizing a component of a polycrystalline diamond compact by at least one magnetic measurement
摘要 In an embodiment, a method of characterizing a polycrystalline diamond compact is disclosed. The method includes providing the polycrystalline diamond compact, and measuring at least one magnetic characteristic of a component of the polycrystalline diamond compact.
申请公布号 US8766628(B2) 申请公布日期 2014.07.01
申请号 US201313790172 申请日期 2013.03.08
申请人 US Synthetic Corporation 发明人 Bertagnolli Kenneth E.;Mukhopadhyay Debkumar
分类号 G01N27/72 主分类号 G01N27/72
代理机构 Dorsey & Whitney LLP 代理人 Dorsey & Whitney LLP
主权项 1. A method of characterizing polycrystalline diamond, the method comprising: providing a polycrystalline diamond compact including a polycrystalline diamond table bonded to a substrate, the polycrystalline diamond table including a plurality of diamond grains defining a plurality of interstitial regions, at least a portion of the plurality of interstitial regions being occupied by a metallic material; separating the polycrystalline diamond table from the substrate; and after the act of separating the polycrystalline diamond table from the substrate, measuring at least one magnetic characteristic of the polycrystalline diamond table.
地址 Orem UT US