发明名称 |
Methods of characterizing a component of a polycrystalline diamond compact by at least one magnetic measurement |
摘要 |
In an embodiment, a method of characterizing a polycrystalline diamond compact is disclosed. The method includes providing the polycrystalline diamond compact, and measuring at least one magnetic characteristic of a component of the polycrystalline diamond compact. |
申请公布号 |
US8766628(B2) |
申请公布日期 |
2014.07.01 |
申请号 |
US201313790172 |
申请日期 |
2013.03.08 |
申请人 |
US Synthetic Corporation |
发明人 |
Bertagnolli Kenneth E.;Mukhopadhyay Debkumar |
分类号 |
G01N27/72 |
主分类号 |
G01N27/72 |
代理机构 |
Dorsey & Whitney LLP |
代理人 |
Dorsey & Whitney LLP |
主权项 |
1. A method of characterizing polycrystalline diamond, the method comprising:
providing a polycrystalline diamond compact including a polycrystalline diamond table bonded to a substrate, the polycrystalline diamond table including a plurality of diamond grains defining a plurality of interstitial regions, at least a portion of the plurality of interstitial regions being occupied by a metallic material; separating the polycrystalline diamond table from the substrate; and after the act of separating the polycrystalline diamond table from the substrate, measuring at least one magnetic characteristic of the polycrystalline diamond table. |
地址 |
Orem UT US |