发明名称 One-time programmable semiconductor device
摘要 According to one disclosed embodiment, an integrated one-time programmable (OTP) semiconductor device pair includes a split-thickness dielectric under an electrode and over an isolation region formed in a doped semiconductor substrate, where a reduced-thickness center portion of the dielectric forms, in conjunction with the isolation region, programming regions of the OTP semiconductor device pair, and where the thicker, outer portions of the dielectric form dielectrics for transistor structures. In one embodiment, the split-thickness dielectric comprises a gate dielectric. In one embodiment, multiple OTP semiconductor device pairs are formed in an array that minimizes the number of connections required to program and sense states of specific OTP cells.
申请公布号 US8766374(B2) 申请公布日期 2014.07.01
申请号 US201213553694 申请日期 2012.07.19
申请人 Broadcom Corporation 发明人 Smith Douglas
分类号 H01L27/112;H01L21/8246 主分类号 H01L27/112
代理机构 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A one-time programmable (OTP) semiconductor device comprising: an isolation region formed in a semiconductor substrate; a dielectric formed over said isolation region; said dielectric having a reduced-thickness portion; said reduced-thickness portion extending beyond said isolation region to form first and second programming regions corresponding to first and second programmable fuses of said OTP semiconductor device.
地址 Irvine CA US