发明名称 Semiconductor device and method for fabricating semiconductor device
摘要 A semiconductor device according to an embodiment, includes a plurality of gate structures; a first dielectric film; and a second dielectric film. The first dielectric film crosslinks adjacent gate structures of the plurality of gate structures so as to form a cavity each above and below in a position between the adjacent gate structures. The second dielectric film is formed as if to cover the cavity above the first dielectric film between the adjacent gate structures.
申请公布号 US8766350(B2) 申请公布日期 2014.07.01
申请号 US201213586167 申请日期 2012.08.15
申请人 Kabushiki Kaisha Toshiba 发明人 Arisumi Osamu;Iinuma Toshihiko
分类号 H01L29/788 主分类号 H01L29/788
代理机构 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A semiconductor device, comprising: a plurality of gate structures; a first dielectric film that builds a bridge over adjacent gate structures of the plurality of gate structures so as to form a first cavity above a position between the adjacent gate structures and a second cavity below the position between the adjacent gate structures; and a second dielectric film formed to cover the first cavity above the first dielectric film between the adjacent gate structures.
地址 Tokyo JP