发明名称 |
Semiconductor device and method for fabricating semiconductor device |
摘要 |
A semiconductor device according to an embodiment, includes a plurality of gate structures; a first dielectric film; and a second dielectric film. The first dielectric film crosslinks adjacent gate structures of the plurality of gate structures so as to form a cavity each above and below in a position between the adjacent gate structures. The second dielectric film is formed as if to cover the cavity above the first dielectric film between the adjacent gate structures. |
申请公布号 |
US8766350(B2) |
申请公布日期 |
2014.07.01 |
申请号 |
US201213586167 |
申请日期 |
2012.08.15 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
Arisumi Osamu;Iinuma Toshihiko |
分类号 |
H01L29/788 |
主分类号 |
H01L29/788 |
代理机构 |
Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A semiconductor device, comprising:
a plurality of gate structures; a first dielectric film that builds a bridge over adjacent gate structures of the plurality of gate structures so as to form a first cavity above a position between the adjacent gate structures and a second cavity below the position between the adjacent gate structures; and a second dielectric film formed to cover the first cavity above the first dielectric film between the adjacent gate structures. |
地址 |
Tokyo JP |