| 摘要 |
The present invention relates to a refresh period test device, and more specifically, to technology for testing faulty possibility of a self refresh period in a semiconductor memory device. The refresh period test device includes: a period control unit outputting an external period signal applied externally in a test mode; and an oscillator selecting unit selecting one of certain period signals having certain periods regardless of the external period signal and temperature according to a period selection signal applied externally in the test mode, wherein faults of self refresh periods can be screened. |
