发明名称 TOP COATING COMPOSITION AND PATTERN FORMING METHOD
摘要 Disclosed is a top coating composition formed on a resist film, for protecting the resist film, the top coating composition being a top coating composition for photoresist, characterized by containing a fluorine-containing polymer having a repeating unit represented by the following general formula (1). This composition is capable of controlling developing solution solubility and has a high water repellency. [In the formula, R1 represents a hydrogen atom, fluorine atom, methyl group or trifluoromethyl group, R2 represents a heat-labile protecting group, R3 represents a fluorine atom or fluorine-containing alkyl group, and W is a bivalent linking group.]
申请公布号 KR101413611(B1) 申请公布日期 2014.07.01
申请号 KR20117027607 申请日期 2010.04.20
申请人 发明人
分类号 C08F20/22;G03F7/11;G03F7/38;H01L21/027 主分类号 C08F20/22
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