发明名称 Control imaging methods in advanced ultrafast electron microscopy
摘要 An optical system includes a beam splitter disposed along an optical axis and a set of mirrors optically coupled to the beam splitter. The set of mirrors are oriented perpendicular to each other. The optical system also includes a turning mirror optically coupled to a second mirror of the set of mirrors and a detector optically coupled to the turning mirror.
申请公布号 US8766181(B2) 申请公布日期 2014.07.01
申请号 US201313893054 申请日期 2013.05.13
申请人 California Institute of Technology 发明人 Zewail Ahmed H.;Baskin John Spencer
分类号 H01J37/26;H01J37/22;G01N23/00 主分类号 H01J37/26
代理机构 Kilpatrick Townsend & Stockton LLP 代理人 Kilpatrick Townsend & Stockton LLP
主权项 1. A microscope system comprising: a microscope column; an electron beam path disposed within the microscope column, wherein the electron beam path impinges on a specimen disposed in the microscope column; a laser beam path operable to support a laser beam and disposed both external to and within the microscope column, wherein the laser beam path impinges on the specimen; a beam splitter disposed along the laser beam path and operable to split the laser beam into a specimen path and a detection path; a set of mirrors disposed along the detection path and optically coupled to the beam splitter, wherein the set of mirrors are oriented perpendicular to each other; a turning mirror disposed along the detection path and optically coupled to a second mirror of the set of mirrors; and a detector optically coupled to the turning mirror.
地址 Pasadena CA US