发明名称 |
Control imaging methods in advanced ultrafast electron microscopy |
摘要 |
An optical system includes a beam splitter disposed along an optical axis and a set of mirrors optically coupled to the beam splitter. The set of mirrors are oriented perpendicular to each other. The optical system also includes a turning mirror optically coupled to a second mirror of the set of mirrors and a detector optically coupled to the turning mirror. |
申请公布号 |
US8766181(B2) |
申请公布日期 |
2014.07.01 |
申请号 |
US201313893054 |
申请日期 |
2013.05.13 |
申请人 |
California Institute of Technology |
发明人 |
Zewail Ahmed H.;Baskin John Spencer |
分类号 |
H01J37/26;H01J37/22;G01N23/00 |
主分类号 |
H01J37/26 |
代理机构 |
Kilpatrick Townsend & Stockton LLP |
代理人 |
Kilpatrick Townsend & Stockton LLP |
主权项 |
1. A microscope system comprising:
a microscope column; an electron beam path disposed within the microscope column, wherein the electron beam path impinges on a specimen disposed in the microscope column; a laser beam path operable to support a laser beam and disposed both external to and within the microscope column, wherein the laser beam path impinges on the specimen; a beam splitter disposed along the laser beam path and operable to split the laser beam into a specimen path and a detection path; a set of mirrors disposed along the detection path and optically coupled to the beam splitter, wherein the set of mirrors are oriented perpendicular to each other; a turning mirror disposed along the detection path and optically coupled to a second mirror of the set of mirrors; and a detector optically coupled to the turning mirror. |
地址 |
Pasadena CA US |