发明名称 WYNN-DYSON IMAGING SYSTEM WITH REDUCED THERMAL DISTORTION
摘要 A Wynn-Dyson imaging system with reduced thermal distortion is disclosed, wherein the reticle and wafer prisms are made of glass material having a coefficient of thermal expansion of no greater than about 100 ppb/°C. The system also includes a first IR-blocking window disposed between the reticle and the reticle prism, and a second matching window disposed between the wafer and the wafer prism to maintain imaging symmetry. The IR-blocking window substantially blocks convective and radiative heat from reaching the reticle prism, thereby reducing the amount of thermally induced image distortion in the reticle image formed on the wafer.
申请公布号 KR20140081684(A) 申请公布日期 2014.07.01
申请号 KR20130155594 申请日期 2013.12.13
申请人 ULTRATECH INC. 发明人 HAWRYLUK ANDREW M.
分类号 H01L21/027 主分类号 H01L21/027
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