发明名称 SEMICONDUCTOR DEVICE, MEMORY DEVICE AND TEST SYSTEM INCLUDING THE SAME
摘要 The present invention relates to a semiconductor device. The semiconductor device according to an embodiment of the present invention includes: an internal voltage generation circuit which generates an internal voltage having a voltage level corresponding to a pre-set value; a comparison unit comparing the internal voltage and an external voltage input from the outside; and a driver which outputs the comparison result of the comparison unit to the outside.
申请公布号 KR20140080310(A) 申请公布日期 2014.06.30
申请号 KR20120149974 申请日期 2012.12.20
申请人 SK HYNIX INC. 发明人 LEE, HYE YOUNG
分类号 G11C29/00;G01R19/165 主分类号 G11C29/00
代理机构 代理人
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