发明名称 |
TEST AND MEASUREMENT INSTRUMENTS, METHOD OF PROVIDING MEASUREMENT DISPLAY, AND COMPUTER PROGRAM THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To provide measurement display capability of a test and measurement instrument.SOLUTION: The test and measurement instrument includes a processor configured to sample input signals and generate a plurality of measurements. The processor is configured to generate a measurement ticker having a plurality of ticker elements configured for presentation on a display in a serial scrolling fashion. Each ticker element has a measurement value associated with the input signal. The processor may be configured to sample a plurality of input signals and each ticker element may include a measurement value associated with at least one of the plurality of input signals. Each ticker element may further comprise a signal source ID and a measurement type. |
申请公布号 |
JP2014119455(A) |
申请公布日期 |
2014.06.30 |
申请号 |
JP20130257014 |
申请日期 |
2013.12.12 |
申请人 |
TEKTRONIX INC |
发明人 |
JAMES D ALLEY;TYLER B NILES |
分类号 |
G01R13/20;G06F3/0485 |
主分类号 |
G01R13/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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