发明名称 TEST AND MEASUREMENT INSTRUMENTS, METHOD OF PROVIDING MEASUREMENT DISPLAY, AND COMPUTER PROGRAM THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide measurement display capability of a test and measurement instrument.SOLUTION: The test and measurement instrument includes a processor configured to sample input signals and generate a plurality of measurements. The processor is configured to generate a measurement ticker having a plurality of ticker elements configured for presentation on a display in a serial scrolling fashion. Each ticker element has a measurement value associated with the input signal. The processor may be configured to sample a plurality of input signals and each ticker element may include a measurement value associated with at least one of the plurality of input signals. Each ticker element may further comprise a signal source ID and a measurement type.
申请公布号 JP2014119455(A) 申请公布日期 2014.06.30
申请号 JP20130257014 申请日期 2013.12.12
申请人 TEKTRONIX INC 发明人 JAMES D ALLEY;TYLER B NILES
分类号 G01R13/20;G06F3/0485 主分类号 G01R13/20
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