| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide an abnormality sign determination circuit that can monitor a sign of a leakage current abnormality of a capacity element in a more appropriate period during an actual use in a market.SOLUTION: While a user is actually using a semiconductor integrated circuit device 100, a resistor Ra within the semiconductor integrated circuit device 100 always detects leakage current of capacitors C1 to C3. If a short-circuit abnormality, for example, occurs in at least one of the capacitors C1 to C3, the leakage current of the capacitor causing the abnormality increases and therefore current flowing through the resistor Ra also increases. Then, the terminal voltage of the resistor Ra increases and therefore a comparator 8 outputs an abnormality detection signal.</p> |
