发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device for high breakdown voltage and high temperature, e.g., a high breakdown voltage module, by preventing partial discharge even when a bubble exists in an insulating sealing member (silicon gel), and to provide a manufacturing method therefor.SOLUTION: In a semiconductor device 100 having conductive thin films 4, 6 fixing onto a ceramic substrate 5, metal electrodes 3, 7 fixing onto the conductive thin films 4, 6, and a silicon gel 13 in contact with the conductive thin films 4, 6 and metal electrodes 3, 7, the conductive thin films 4, 6 protrude from the end of interface where the metal electrodes 3, 7 and conductive thin films 4, 6 are fixed, and a continuous recess 16 is provided in the outer periphery of the metal electrodes 3, 7, fixing to the conductive thin films 4, 6, on the fixing side thereof.
申请公布号 JP2014120728(A) 申请公布日期 2014.06.30
申请号 JP20120277173 申请日期 2012.12.19
申请人 FUJI ELECTRIC CO LTD;FUJI ELECTRIC FA COMPONENTS & SYSTEMS CO LTD 发明人 HAYASE YUJI;HANAOMOTE HIROTAKA
分类号 H01L23/12 主分类号 H01L23/12
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