发明名称 QUANTITATIVE ANALYSIS METHOD FOR MEASUREMENT TARGET ELEMENT IN SPECIMEN USING LASER-INDUCED PLASMA SPECTRUM
摘要 PROBLEM TO BE SOLVED: To provide a method which is capable of calculating the intensity of a laser-induced plasma spectrum even when peaks of the spectrum very closely overlap each other in laser-induced plasma spectroscopy, and is capable of searching for a peak having excellent precision and reproducibility when an analysis target element has a high concentration.SOLUTION: A quantitative analysis method for a measurement target element in a specimen using laser-induced plasma spectrum includes: irradiating a specimen containing a measurement target element with a laser beam to generate plasma; obtaining an optical spectrum generated from the plasma; obtaining a fitting curve in an area where at least one measurement target peak is excluded, in the optical spectrum; separating and obtaining a measurement target peak curve including at least one measurement target peak, by excluding the fitting curve in the optical spectrum; calculating peak intensities at specific wavelengths selected on the fitting curve and the measurement target peak curve; and obtaining a composition ratio of the measurement target element on the basis of a ratio of peak intensities at the specific wavelengths selected on each curve.
申请公布号 JP2014119457(A) 申请公布日期 2014.06.30
申请号 JP20130258001 申请日期 2013.12.13
申请人 GWANGJU INST OF SCIENCE &amp, TECHNOLOGY 发明人 JEONG SUNG HO;IN JEONG HWAN;LEE SEOKHEE;KIM CHAN KYU
分类号 G01N21/63 主分类号 G01N21/63
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