发明名称 QUANTIZER, COMPARISON CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a quantizer, a comparison circuit and a semiconductor integrated circuit that perform a normal operation by shortening the time for which a through current flows through the quantizer.SOLUTION: A quantizer 12 for receiving an analog signal Q and outputting a binary signal SS includes through current detection sections M1, M2 for detecting a through current flowing through the quantizer, and feedback sections M5-M7, M8-M10 for feeding back a signal from the through current detection section to control a charge of an input N1 of the quantizer.
申请公布号 JP2014120977(A) 申请公布日期 2014.06.30
申请号 JP20120275540 申请日期 2012.12.18
申请人 FUJITSU LTD;FUJITSU SEMICONDUCTOR LTD 发明人 NAKAMOTO HIROYUKI;OKI HIDETA
分类号 H03K5/08 主分类号 H03K5/08
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