| 摘要 |
FIELD: physics.SUBSTANCE: method of inspecting the quality of a light-emitting diode (LED) structure involves detecting radiation of the LED structure, processing the radiation to obtain characteristics of the LED structure, which are then used to determine the quality of the LED structure, wherein for each LED structure from a batch of items, the electroluminescence spectrum is recorded, the recorded spectrum is constructed in semi-logarithmic scale, the short-wave region of the obtained spectrum is divided into sections which are approximated with a certain relationship, and the approximated sections with maximum and minimum inclination are selected; the maximum and minimum temperature of the LED structure on the selected sections is determined, the average temperature difference value is calculated, the temperature difference value for each LED structure is compared with an average, if the temperature difference value is greater than the average value, the structure is of low quality.EFFECT: method reduces the cost, enables to use less bulky and cheaper equipment and enables to determine the quality of packaged LEDs, including LEDs in LED-based articles.4 dwg, 2 tbl |
