DEVICE TO EXAMINE MATERIALS IN DEFORMED STATE BY ATOMIC-FORCE MICROSCOPE METHOD

摘要

FIELD: measurement equipment.SUBSTANCE: invention relates to the examination of materials by means of an atomic-force microscope and can be used to examine materials in different deformed states. Device represents a mechanism built-in in the microscope and intended to move the clamps with a fixed sample to the opposite sides; it comprises a common metal base set on the carrier of the microscope sample holder where two parallel guides are mounted on both sides and provide for travelling of the movable clamps when a screw hand is turned. Approaching and retracting of a scanning probe is performed automatically with the help of a microscope positioner.EFFECT: simplified examination of materials, provision for safekeeping of probes.2 dwg