| 摘要 |
PROBLEM TO BE SOLVED: To obtain a transmission electron microscope including a function for displaying with the same brightness, by correcting uneven thickness or deflection of a sample, that is a problem in the sample preparation.SOLUTION: A transmission electron microscope comprises: an electron gun; a detector for detecting transmitted electrons by irradiating a sample with an electron ray emitted from the electron gun; a processing unit for processing a signal detected by the detector; and a display device for displaying the signal processed by the processing unit as a sample image. The processing unit corrects the brightness or contrast of one area, out of two areas of different brightness or contrast on the sample image, so as to match those of the other area, and displays a corrected image on the display device. |
