发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE
摘要 The inventive concept provides methods for manufacturing a semiconductor substrate. The method may include forming a stop pattern surrounding an edge of a substrate, forming a transition layer an entire top surface of the substrate except the stop pattern, and forming an epitaxial semiconductor layer on the transition layer and the stop pattern. The epitaxial semiconductor layer may not be grown from the stop pattern. That is, the epitaxial semiconductor layer may be isotropically grown from a top surface and a sidewall of the transition layer by a selective isotropic growth method, so that the epitaxial semiconductor layer may gradually cover the stop pattern.
申请公布号 US2014179088(A1) 申请公布日期 2014.06.26
申请号 US201313897706 申请日期 2013.05.20
申请人 Electronics and Telecommunications Research Institute 发明人 BAE Sung-Bum;Kim Sung Bock;Mun Jae Kyoung;Nam Eun Soo
分类号 H01L21/02 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method for manufacturing a semiconductor substrate, the method comprising: forming a stop pattern surrounding an edge of a substrate; forming a transition layer an entire top surface of the substrate except the stop pattern; and forming an epitaxial semiconductor layer on the transition layer and the stop pattern, wherein the epitaxial semiconductor layer is not grown from the stop pattern; and wherein the epitaxial semiconductor layer is isotropically grown from a top surface and a sidewall of the transition layer by a selective isotropic growth method, so that the epitaxial semiconductor layer gradually covers the stop pattern.
地址 Daejeon KR