发明名称 REFLECTION CHARACTERISTIC MEASURING APPARATUS
摘要 A measuring apparatus includes an illumination device including a surface light source, a detector configured to detect a light intensity distribution formed on a light-receiving surface by reflected light, and a processor configured to obtain the reflection characteristic based on first data of the light intensity distribution detected by the detector. The processor is configured to estimate, based on the first data, second data of a light intensity distribution formed by specular reflected light and third data of a light intensity distribution formed by diffuse reflected light in a case where a point light source is disposed at each position in a light-emitting region of the surface light source, and to estimate, based on the second data and the third data, a light intensity distribution formed by reflected light from the surface.
申请公布号 US2014176953(A1) 申请公布日期 2014.06.26
申请号 US201314138369 申请日期 2013.12.23
申请人 CANON KABUSHIKI KAISHA 发明人 KATO Shigeki
分类号 G01N21/47;G01N21/55 主分类号 G01N21/47
代理机构 代理人
主权项 1. A measuring apparatus for measuring a reflection characteristic of a surface, the measuring apparatus comprising: an illumination device including a surface light source and configured to illuminate the surface with light from the surface light source; a detector configured to detect a light intensity distribution formed on a light-receiving surface by reflected light from the surface illuminated by said illumination device; and a processor configured to obtain the reflection characteristic based on first data of the light intensity distribution detected by said detector, wherein said processor is configured to estimate, based on the first data, second data of a light intensity distribution formed on the light-receiving surface by specular reflected light from the surface and third data of a light intensity distribution formed on the light-receiving surface by diffuse reflected light from the surface in a case where a point light source is disposed at each position in a light-emitting region of the surface light source, and to estimate, based on the second data and the third data, a light intensity distribution formed on the light-receiving surface by reflected light from the surface in a case where a light source, at least one of a shape and a size of a light-emitting region of which is different from that of the surface light source, is disposed in place of the surface light source.
地址 Tokyo JP