| 摘要 |
PROBLEM TO BE SOLVED: To provide a device and method for measuring gas components in a gas with high measurement precision.SOLUTION: A device for measuring gas components in a gas includes: a branch tube 13a into which a high pressure gas 11 generated in, for example, a gasification furnace (omitted in Figure) is branched from a header 12; a high pressure gas measurement site 22 which is inserted to the branch tube 13a and irradiates a branched gas 11a with a laser beam 21 to measure laser Raman scattering; first laser measurement means 23 which irradiates the high pressure gas measurement site 22 with the laser beam 21 and receives generated Raman scattering light 25; an orifice 31 as pressure reduction means which is provided on the wake side of the high pressure gas measurement site 22 and makes a low pressure gas 11b of the branched gas 11a; and second laser measurement means 41 which is inserted to a branch tube 13b on the wake side of the orifice 31 and performs semiconductor laser measurement of a gas composition in the low pressure gas 11b. |
