发明名称 STORAGE APPARATUS
摘要 A storage apparatus writes data to a storage drive or reads data from a storage drive in response to an I/O request sent from a server. The storage apparatus includes a plurality of AC-DC power supplies supplying the storage drive with drive power is provided with a plurality of power supply paths provided for the respective AC-DC power supplies. A plurality of gate units are provided to the respective power supply paths and configured to stop supplying drive power to the storage drive through the corresponding power supply path when detecting voltage abnormality in the drive power supplied from the AC-DC power supply to the storage drive. The power supply paths allow each of the storage drives belonging to a same RAID group to receive the supply of the drive power from the AC-DC power supplies through different power supply paths, respectively.
申请公布号 US2014181565(A1) 申请公布日期 2014.06.26
申请号 US201314132489 申请日期 2013.12.18
申请人 Hitachi, Ltd. 发明人 OGURO Ryohei;Tsuyuki Yosuke
分类号 G06F1/32 主分类号 G06F1/32
代理机构 代理人
主权项 1. A storage apparatus that writes data to a storage drive or reads data from a storage drive in response to an I/O request sent from an external device, the storage apparatus comprising: a plurality of power supply devices that supplies the storage drive with drive power; and a plurality of gate units to stop supplying drive power to the storage drives, wherein each of the gate units include: a first voltage abnormality detection circuit that detects a voltage abnormality in power supplied from the power supply device; a voltage conversion circuit that convert a first voltage supplied from the power supply device to a second voltage for supplying the storage drives with drive power of the second voltage; a second voltage abnormality detection circuit that detects a voltage abnormality supplied from the voltage conversion circuit; a second back-flow prevention circuit, which is coupled between the second voltage abnormality detection circuit and storage devices, that prevents a back-flow of a current; and a gate circuit, which is coupled between the first voltage abnormality detection circuit and the voltage conversion circuit, that stops supplying the first voltage to the storage drive when the first voltage abnormality detection circuit or second voltage abnormality detection circuit detects the voltage abnormality.
地址 Tokyo JP