The present invention relates to a probe card assembly having a probe pin for coming in contact with an integrated circuit device to carry out an electrical inspection of the integrated circuit device; and a probe card to which the probe pin is fixed. The probe card assembly may comprise a connector of which one side faces the probe card to be electrically connected to the probe card and of which the other side is interposed between the probe card and the probe pin to allow the probe pin to be disposed on it; and a transmission line for electrically connecting the probe pin to the connector to electrically connect the probe card and the probe pin.
