发明名称 METHOD FOR FORMING A RETICLE PATTERN
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for forming a reticle pattern unlikely to entail reticle inspection errors.SOLUTION: The provided method comprises: a first step of optical-proximity-correction-processing (OPC-processing) a first pattern and a second pattern; a second step of inspecting whether or not the gap between the first vertex of a first interior angle of less than 180° included within the OPC-processed first pattern and the second vertex of a second interior angle of less than 180° included within the OPC-processed second pattern is narrower than a reference value, and a third step of deleting, from the first pattern, a first vertex portion including first vertex and deleting, from the second pattern, a second vertex portion including second vertex in a case where the gap is narrower than the reference value.</p>
申请公布号 JP2014115415(A) 申请公布日期 2014.06.26
申请号 JP20120268581 申请日期 2012.12.07
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 MIYAJIMA MASAAKI;ITO YOSHIO
分类号 G03F1/70;G03F1/36;H01L21/027 主分类号 G03F1/70
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