LOCATING OF ONE OR MORE DEFECTS IN AN ELECTROCHEMICAL ASSEMBLY

摘要

The subject of the present invention relates to a method of locating one or more defects in an assembly comprising an electrochemical device and a peripheral system allowing the operation of said electrochemical device, said method comprising: a step of decomposition (S1) consisting in applying a wavelet transform to a signal measured on the electrochemical device so as to decompose said signal into a plurality of subsignals, a step of quantization (S2) consisting in estimating the distribution of the energy (Ej) of each subsignal, a step of determination (S4) consisting in calculating an entropy (ER) so as to determine a signature of the signal, and d) a step of location (S5) consisting in analysing said signature in such a way as to allow the locating of a defect in said assembly.