发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device with a composition capable of inhibiting deterioration in electrical characteristics, which becomes prominent with microfabrication.SOLUTION: A semiconductor device comprises a plurality of gate electrode layers separated at a distance from each other. One gate electrode layer included in the plurality of gate electrode layers has portions which overlap respective parts of an oxide semiconductor layer, a source electrode layer and a drain electrode layer; the gate electrode layers included in the plurality of gate electrode layers other than the one gate electrode layer overlap a part of an end of the oxide semiconductor layer; and a length of each of the source electrode layer and the drain electrode layer in a channel width direction is shorter than a length of the one gate electrode layer in a channel width direction.
申请公布号 JP2014116596(A) 申请公布日期 2014.06.26
申请号 JP20130234874 申请日期 2013.11.13
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MATSUBAYASHI DAISUKE;SHINOHARA SOJI;SEKINE WATARU;KUSUMOTO NAOTO
分类号 H01L29/786;H01L21/336;H01L21/8242;H01L21/8247;H01L27/105;H01L27/108;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L29/786
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