发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device with a composition capable of inhibiting deterioration in electrical characteristics, which becomes prominent with microfabrication.SOLUTION: A semiconductor device comprises a plurality of gate electrode layers separated at a distance from each other. One gate electrode layer included in the plurality of gate electrode layers has portions which overlap respective parts of an oxide semiconductor layer, a source electrode layer and a drain electrode layer; the gate electrode layers included in the plurality of gate electrode layers other than the one gate electrode layer overlap a part of an end of the oxide semiconductor layer; and a length of each of the source electrode layer and the drain electrode layer in a channel width direction is shorter than a length of the one gate electrode layer in a channel width direction. |
申请公布号 |
JP2014116596(A) |
申请公布日期 |
2014.06.26 |
申请号 |
JP20130234874 |
申请日期 |
2013.11.13 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
MATSUBAYASHI DAISUKE;SHINOHARA SOJI;SEKINE WATARU;KUSUMOTO NAOTO |
分类号 |
H01L29/786;H01L21/336;H01L21/8242;H01L21/8247;H01L27/105;H01L27/108;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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