| 摘要 |
PROBLEM TO BE SOLVED: To reduce an influence arising from a tilt of a retroreflection mirror as to analysis accuracy of characteristics of a measured object employing a terahertz wave.SOLUTION: A terahertz wave measurement device (100) comprises: generation means (110) that is irradiated with first laser light (LB1) to thereby generate a terahertz wave (THz); and retro-reflection means (120) that retro-reflects the first laser light. Detection means has direction dependency in which a tolerance of a position displacement along a first direction (Z1) of an irradiation position of second laser light is larger than a tolerance of a position displacement along a second direction (Y1) of the irradiation position of the second laser light. While a tilt of the retro-reflection means along a third direction (Z2) makes the retro-reflection of the retro-reflection means unperformable, the retro-reflection means has direction dependency in which the retro-reflection is performable even if the tilt of the retro-reflection means along a fourth direction (Y2) is generated, and the first direction (Z1) and the third direction (Z2) are aligned. |
