发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 An object is to manufacture a semiconductor device including an oxide semiconductor at low cost with high productivity in such a manner that a photolithography process is simplified by reducing the number of light-exposure masks In a method for manufacturing a semiconductor device including a channel-etched inverted-staggered thin film transistor, an oxide semiconductor film and a conductive film are etched using a mask layer formed with the use of a multi-tone mask which is a light-exposure mask through which light is transmitted so as to have a plurality of intensities. In etching steps, a first etching step is performed by wet etching in which an etchant is used, and a second etching step is performed by dry etching in which an etching gas is used.
申请公布号 US2014179058(A1) 申请公布日期 2014.06.26
申请号 US201414191853 申请日期 2014.02.27
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 SUZAWA Hideomi;SASAGAWA Shinya;MURAOKA Taiga;ITO Shunichi;HOSOBA Miyuki
分类号 H01L29/66 主分类号 H01L29/66
代理机构 代理人
主权项 1. (canceled)
地址 Atsugi-shi JP