发明名称 METHOD OF SEPARATING SUBSTRATE AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME
摘要 A method of fabricating a semiconductor device, the method including: forming a first mask pattern including a masking region and an open region on a substrate; forming a sacrificial layer to cover the substrate and the first mask pattern; patterning the sacrificial layer to form a seed layer and to expose the first mask pattern; forming a second mask pattern on the exposed first mask pattern; forming an epitaxial layer on the seed layer and the second mask pattern, and forming a void between the second mask pattern and the epitaxial layer; and separating the substrate from the epitaxial layer.
申请公布号 US2014179043(A1) 申请公布日期 2014.06.26
申请号 US201314138923 申请日期 2013.12.23
申请人 Seoul Viosys Co., Ltd. 发明人 Jang Jong Min;Kim Hwa Mok;Lee Kyu Ho;Kim Chang Hoon;Suh Daewoong;In Chi Hyun;Park Dae Seok;Chae Jong Hyeon
分类号 H01L33/00 主分类号 H01L33/00
代理机构 代理人
主权项 1. A method of separating a substrate, comprising: forming a first mask pattern comprising a masking region and an open region, on a substrate; forming a sacrificial layer covering the substrate and the first mask pattern; patterning the sacrificial layer to form a seed layer and to expose at least a portion of the first mask pattern; forming a second mask pattern on the exposed portion of the first mask pattern; forming an epitaxial layer on the seed layer and the second mask pattern, and forming a void between the second mask pattern and the epitaxial layer; and separating the substrate and the epitaxial layer.
地址 Ansan-si KR