发明名称 EXPITAXIAL FILM ON NANOSCALE STRUCTURE
摘要 <p>An embodiment of the invention includes an epitaxial layer that directly contacts, for example, a nanowire, fin, or pillar in a manner that allows the layer to relax with two or three degrees of freedom. The epitaxial layer may be included in a channel region of a transistor. The nanowire, fin, or pillar may be removed to provide greater access to the epitaxial layer. Doing so may allow for a "all-around gate" structure where the gate surrounds the top, bottom, and sidewalls of the epitaxial layer. Other embodiments are described herein.</p>
申请公布号 WO2014099036(A1) 申请公布日期 2014.06.26
申请号 WO2013US48797 申请日期 2013.06.29
申请人 INTEL CORPORATION 发明人 CHU-KUNG, BENJAMIN;LE, VAN H.;CHAU, ROBERT S.;DASGUPTA, SANSAPTAK;DEWEY, GILBERT;GOEL, NITIKA;KAVALIEROS, JACK T.;METZ, MATTHEW V.;MUKHERJEE, NILOY;PILLARISETTY, RAVI;RACHMADY, WILLY;RADOSAVLJEVIC, MARKO;THEN, HAN WUI;ZELICK, NANCY M.
分类号 H01L21/20 主分类号 H01L21/20
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