| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a testing device capable of preventing point contact between a terminal and a contact part, and also preventing flaws on the terminal.SOLUTION: A testing device of the present invention includes: a first contact part 10 that has a first convex-curved surface 10c and is formed of a conductive material; a second contact part 14 that has a second convex-curved surface 14c which is provided so as to oppose to the first convex-curved surface 10c, and that is formed of a conductive material; and a moving apparatus that moves the first contact part 10 and the second contact part 14 so as to sandwich a terminal 102a of a semiconductor device 102 between the first convex-curved surface 10c and the second convex-curved surface 14c.</p> |
