发明名称 PROJECTION EXPOSURE APPARATUS COMPRISING ACTUATOR SYSTEM
摘要 <p>PROBLEM TO BE SOLVED: To disclose a projection exposure apparatus for semiconductor lithography indicating improvement of heat management.SOLUTION: A projection exposure apparatus for semiconductor lithography comprises a projection objective lens. The projection objective lens includes a projection objective lens housing and an actuator system 1 for mechanical actuation of at least one optical component 7 disposed within the projection objective lens. The actuator system 1 includes at least one of means 60, 6, 2, 4 for reducing heat transfer into at least one optical component 7 caused by heat generated during operation of the actuator system 1. The actuator system includes an attenuation system, the attenuation system comprises a vibration-proof mass body including a damper, and the mass body is disposed outside of the objective lens housing.</p>
申请公布号 JP2014116609(A) 申请公布日期 2014.06.26
申请号 JP20130267424 申请日期 2013.12.25
申请人 CARL ZEISS SMT GMBH 发明人 SIGEL BENJAMIN;ANDREAS BERTELE;PETER KLOESCH;MARTIN MAHLMANN;WEBER JOCHEN
分类号 H01L21/027;G02B7/04 主分类号 H01L21/027
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