发明名称 Idle Phase Prediction For Integrated Circuits
摘要 A method and apparatus for idle phase prediction in integrated circuits is disclosed. In one embodiment, an integrated circuit (IC) includes a functional unit configured to cycle between intervals of an active state and an idle state. The IC further includes a prediction unit configured to record a history of idle state durations for a plurality of intervals of the idle state. Based on the history of idle state durations, the prediction unit is configured to generate a prediction of the duration of the next interval of the idle state. The prediction may be used by a power management unit to, among other uses, determine whether to place the functional unit in a low power (e.g., sleep) state.
申请公布号 US2014181553(A1) 申请公布日期 2014.06.26
申请号 US201213723868 申请日期 2012.12.21
申请人 ADVANCED MICRO DEVICES, INC. 发明人 Eckert Yasuko;Manne Srilatha;Bircher William L.;Govindan Mahdu S.S.;Schulte Michael J.
分类号 G06F1/32 主分类号 G06F1/32
代理机构 代理人
主权项 1. A method comprising: recording a history of idle state durations for a plurality of intervals of an idle state of a functional unit of an integrated circuit (IC), the intervals of the idle states of the functional unit occurring between intervals of an active state of the functional unit; and predicting a duration of a next interval of the idle state based on the history of idle state durations.
地址 Sunnyvale CA US