发明名称 |
Idle Phase Prediction For Integrated Circuits |
摘要 |
A method and apparatus for idle phase prediction in integrated circuits is disclosed. In one embodiment, an integrated circuit (IC) includes a functional unit configured to cycle between intervals of an active state and an idle state. The IC further includes a prediction unit configured to record a history of idle state durations for a plurality of intervals of the idle state. Based on the history of idle state durations, the prediction unit is configured to generate a prediction of the duration of the next interval of the idle state. The prediction may be used by a power management unit to, among other uses, determine whether to place the functional unit in a low power (e.g., sleep) state. |
申请公布号 |
US2014181553(A1) |
申请公布日期 |
2014.06.26 |
申请号 |
US201213723868 |
申请日期 |
2012.12.21 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
Eckert Yasuko;Manne Srilatha;Bircher William L.;Govindan Mahdu S.S.;Schulte Michael J. |
分类号 |
G06F1/32 |
主分类号 |
G06F1/32 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method comprising:
recording a history of idle state durations for a plurality of intervals of an idle state of a functional unit of an integrated circuit (IC), the intervals of the idle states of the functional unit occurring between intervals of an active state of the functional unit; and predicting a duration of a next interval of the idle state based on the history of idle state durations. |
地址 |
Sunnyvale CA US |