发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To impart stable electrical characteristics to a transistor using an oxide semiconductor film, to impart excellent electrical characteristics to a transistor using an oxide semiconductor film, and to provide a highly reliable semiconductor device having the transistor.SOLUTION: The transistor has: a multilayer film in which an oxide semiconductor film and an oxide film are laminated; a gate electrode; and a gate insulating film. The multilayer film is provided to overlap the gate electrode via the gate insulating film. The multilayer film has a shape having a first angle formed by a lower surface of the oxide semiconductor film and a side surface of the oxide semiconductor film, and a second angle formed by a lower surface of the oxide film and a side surface of the oxide film. The first angle is smaller than the second angle and is an acute angle. The semiconductor device is manufactured by using the transistor. |
申请公布号 |
JP2014116588(A) |
申请公布日期 |
2014.06.26 |
申请号 |
JP20130231888 |
申请日期 |
2013.11.08 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
SATO TAKAHIRO;NAKAZAWA YASUTAKA;CHO TAKAYUKI;KOSHIOKA SHUNSUKE;TOKUNAGA HAJIME;KAMINAGA MASAMI |
分类号 |
H01L29/786;G09F9/30;H01L21/28;H01L21/336;H01L21/8234;H01L21/8238;H01L27/08;H01L27/088;H01L27/092;H01L29/417;H01L51/50;H05B33/08;H05B33/14 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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