发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To impart stable electrical characteristics to a transistor using an oxide semiconductor film, to impart excellent electrical characteristics to a transistor using an oxide semiconductor film, and to provide a highly reliable semiconductor device having the transistor.SOLUTION: The transistor has: a multilayer film in which an oxide semiconductor film and an oxide film are laminated; a gate electrode; and a gate insulating film. The multilayer film is provided to overlap the gate electrode via the gate insulating film. The multilayer film has a shape having a first angle formed by a lower surface of the oxide semiconductor film and a side surface of the oxide semiconductor film, and a second angle formed by a lower surface of the oxide film and a side surface of the oxide film. The first angle is smaller than the second angle and is an acute angle. The semiconductor device is manufactured by using the transistor.
申请公布号 JP2014116588(A) 申请公布日期 2014.06.26
申请号 JP20130231888 申请日期 2013.11.08
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 SATO TAKAHIRO;NAKAZAWA YASUTAKA;CHO TAKAYUKI;KOSHIOKA SHUNSUKE;TOKUNAGA HAJIME;KAMINAGA MASAMI
分类号 H01L29/786;G09F9/30;H01L21/28;H01L21/336;H01L21/8234;H01L21/8238;H01L27/08;H01L27/088;H01L27/092;H01L29/417;H01L51/50;H05B33/08;H05B33/14 主分类号 H01L29/786
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