发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which enables uniform formation of an encapsulation resin by inhibiting a jetting phenomenon occurring due to an increase in injection rate of the resin with an increase in size of the semiconductor device thereby to improve insulation reliability.SOLUTION: A semiconductor device comprises: a metallic member 2 on which a semiconductor element 20 is mounted on one surface; a printed wiring board 3 which is arranged opposite to the metallic member 2 and has convex parts 13 at least on one side, and on which an electric component 4 is mounted; and an encapsulation resin 10 for encapsulating the metallic member 2 and the printed wiring board 3. The encapsulation resin 10 is encapsulated by use of a mold 21 and injected from injection ports 16 of the mold 21, which are opposite to the convex parts 13.
申请公布号 JP2014116366(A) 申请公布日期 2014.06.26
申请号 JP20120267505 申请日期 2012.12.06
申请人 MITSUBISHI ELECTRIC CORP 发明人 YAMAMOTO KEI;TADA KAZUHIRO;KITAI KIYOFUMI;YOSHIHARA HIROYUKI
分类号 H01L21/56;H01L25/00;H01L25/07;H01L25/18 主分类号 H01L21/56
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