发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which enables uniform formation of an encapsulation resin by inhibiting a jetting phenomenon occurring due to an increase in injection rate of the resin with an increase in size of the semiconductor device thereby to improve insulation reliability.SOLUTION: A semiconductor device comprises: a metallic member 2 on which a semiconductor element 20 is mounted on one surface; a printed wiring board 3 which is arranged opposite to the metallic member 2 and has convex parts 13 at least on one side, and on which an electric component 4 is mounted; and an encapsulation resin 10 for encapsulating the metallic member 2 and the printed wiring board 3. The encapsulation resin 10 is encapsulated by use of a mold 21 and injected from injection ports 16 of the mold 21, which are opposite to the convex parts 13. |
申请公布号 |
JP2014116366(A) |
申请公布日期 |
2014.06.26 |
申请号 |
JP20120267505 |
申请日期 |
2012.12.06 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
YAMAMOTO KEI;TADA KAZUHIRO;KITAI KIYOFUMI;YOSHIHARA HIROYUKI |
分类号 |
H01L21/56;H01L25/00;H01L25/07;H01L25/18 |
主分类号 |
H01L21/56 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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