发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method which can inhibit voids and achieve high reliability.SOLUTION: A semiconductor device manufacturing method comprises a process of thermal pressure bonding a semiconductor chip on which a film adhesive is bonded on a bump electrode formation surface with a substrate on which a film adhesive is bonded so as to oppose the film adhesives to each other.
申请公布号 JP2014116503(A) 申请公布日期 2014.06.26
申请号 JP20120270470 申请日期 2012.12.11
申请人 SEKISUI CHEM CO LTD 发明人 SADANAGA SHUJIRO;NAKAGAWA HIROAKI;NISHIMURA YOSHIO
分类号 H01L21/60;C09J7/00;C09J11/04;C09J201/00 主分类号 H01L21/60
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