发明名称 TESTING SYSTEM AND METHOD
摘要 A testing system for use in conducting testing of a structure, and a method for configuring a testing system are provided. The testing system includes a testing device that includes a presentation interface, a user input interface, a memory device and a processor coupled in communication with the presentation interface, the user input interface, and the memory device. The processor causes the testing device to present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device, and at least one test instruction for use while the user is conducting a test session using the device.
申请公布号 US2014178853(A1) 申请公布日期 2014.06.26
申请号 US201213725091 申请日期 2012.12.21
申请人 GENERAL ELECTRIC COMPANY 发明人 Groninger Daniel Scott;Ward Robert Carroll;de Fromont Francois Xavier;Shaffer Chad Martin
分类号 G09B5/00 主分类号 G09B5/00
代理机构 代理人
主权项 1. A testing system for use in conducting testing of a structure, comprising: a testing device comprising: a presentation interface;a user input interface;a memory device; anda processor coupled in communication with the presentation interface, the user input interface, and the memory device, the processor programmed to cause the testing device to: present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device; andpresent to the user during a test session at least one test instruction for use of the testing device.
地址 Schenectady NY US