发明名称 |
TESTING SYSTEM AND METHOD |
摘要 |
A testing system for use in conducting testing of a structure, and a method for configuring a testing system are provided. The testing system includes a testing device that includes a presentation interface, a user input interface, a memory device and a processor coupled in communication with the presentation interface, the user input interface, and the memory device. The processor causes the testing device to present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device, and at least one test instruction for use while the user is conducting a test session using the device. |
申请公布号 |
US2014178853(A1) |
申请公布日期 |
2014.06.26 |
申请号 |
US201213725091 |
申请日期 |
2012.12.21 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
Groninger Daniel Scott;Ward Robert Carroll;de Fromont Francois Xavier;Shaffer Chad Martin |
分类号 |
G09B5/00 |
主分类号 |
G09B5/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. A testing system for use in conducting testing of a structure, comprising:
a testing device comprising:
a presentation interface;a user input interface;a memory device; anda processor coupled in communication with the presentation interface, the user input interface, and the memory device, the processor programmed to cause the testing device to:
present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device; andpresent to the user during a test session at least one test instruction for use of the testing device. |
地址 |
Schenectady NY US |