发明名称 OPTICAL WAVEGUIDE ELEMENT EVALUATION APPARATUS, AND OPTICAL WAVEGUIDE ELEMENT EVALUATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide an optical waveguide element evaluation apparatus that can separate stray light and evaluate distribution of optical angle distribution in optical waveguide elements.SOLUTION: An optical waveguide element evaluation apparatus comprises optical path setting means (6 and 7) that form an image of a near field pattern 5 of the emitted light end face of an optical waveguide element in the air, a pinhole plate 14 provided with an aperture that transmits an imaged near field pattern 13, and a detector 18 that detects the spreading angle of light at the emitted light end face by using a far field pattern formed by light transmitted by the pinhole plate 14.
申请公布号 JP2014115249(A) 申请公布日期 2014.06.26
申请号 JP20120271474 申请日期 2012.12.12
申请人 HITACHI LTD 发明人 IWANABE YASUHIKO;MIYAMOTO JIICHI
分类号 G01M11/00 主分类号 G01M11/00
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