| 摘要 |
<p>An optical observation device (1A) is provided with: a spatial optical modulator (20) that displays a Fresnel kinoform on a phase modulation surface (20a), modulates the phase of light (L1), and irradiates an object (B) to be observed with a modulated light (L2); an imaging optical system (15) that images light (L3) to be observed from the object (B) to be observed; an optical system moving mechanism (16) that moves the imaging optical system (15) in the direction of the optical axis of the light (L3) to be observed; and a control unit (19) that controls the optical system moving mechanism (16) such that the focal position of the imaging optical system (15) changes in correspondence with changes in the focal position of the modulated light (L2) because of the Fresnel kinoform. Thus, an optical observation device that can easily obtain an observation light image for an irradiated site even when the focal position of the modulated light changes in the direction of the optical axis is achieved.</p> |
