发明名称 |
Method of calibrating surface texture measurement device |
摘要 |
<p>A method of calibrating a surface texture measurement device includes obtaining Y-axis shape measurement data and a maximum diameter portion to obtain upper and lower maximum diameter portions of a reference sphere 100 from Y-axis upper and lower shape data obtained by relatively moving in the Y-axis direction while a downward and an upward styluses 26B, 26A are in contact with an upper and a lower surfaces, respectively, of the reference sphere 100; obtaining X-axis shape measurement data to obtain X-axis upper and lower shape data of the reference sphere 100 by relatively moving in the X-axis direction while the downward stylus 26B is in contact with the upper diameter portion and the upward stylus 26A with the lower diameter portion of the reference sphere 100; and calculating offset amounts ”x and ”z of the upward and downward styluses from center coordinates 03 and 04 obtained from the shape data.</p> |
申请公布号 |
EP2500684(B1) |
申请公布日期 |
2014.06.25 |
申请号 |
EP20120159875 |
申请日期 |
2012.03.16 |
申请人 |
MITUTOYO CORPORATION |
发明人 |
OMORI, YOSHIYUKI;MIKI, SHOUSEI |
分类号 |
G01B5/20;G01B5/28;G01B21/04;G01Q40/00 |
主分类号 |
G01B5/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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