| 摘要 |
The present invention relates to an apparatus for measuring the shape of a material, including: a support for supporting the material; a side contact device which is in contact with the side of the material, which is mounted on the support, to calibrate the direction and location of the material; a rail which is installed and elongated lengthwise to the material; a moving support which moves along the rail; and a width measuring sensor installed on the moving support which measures the width of the material along the overall length of the material. |
