发明名称 Method of processing a silicon wafer
摘要 <p>A method (600) of processing a silicon wafer (100, 150; 200, 250) is disclosed. The method (600) comprises providing a flash memory region (101, 151; 201, 251) in the silicon wafer (100, 150; 200, 250) and providing a bipolar transistor (158, 160; 258, 260) with a polysilicon external base in the silicon wafer (100, 150; 200, 250). Providing the flash memory region (101, 151; 201, 251) and providing the bipolar transistor (158, 160; 258, 260) comprises a step of depositing a single polysilicon layer common to both the flash memory region (101, 151; 201, 251) and the bipolar transistor (158, 160; 258, 260).</p>
申请公布号 EP2747131(A1) 申请公布日期 2014.06.25
申请号 EP20120197808 申请日期 2012.12.18
申请人 NXP B.V. 发明人 GRIDELET,, EVELYNE;MERTENS,, HANS;VAN DUUREN,, MICHIEL JOS;VANHOUCKE,, TONY;DINH,, VIET THANH
分类号 H01L27/115;H01L21/8249;H01L27/06 主分类号 H01L27/115
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