Method and apparatus for testing a substrate for display device

摘要

Disclosed is a test method an apparatus in which an area for test and an area for analysis are specified based on the design information of the display device having a non-rectangular display area. To carry out testing, parasitic capacitances are found using the design information, and operations for weighting are performed on test data or threshold values based on which a decision on pass/fail is to be made.

主权项

1. A method for testing a substrate for a display device, the method comprising:
inputting design information for the display device; specifying at least one of a target area for test and a target area for analysis in the substrate, based on the design information; generating weighting information for a detection result by test, based on the design information; performing operation on the detection result of test of an object under test in the substrate and the weighting information; and making a decision on pass/fail of the object under test in the substrate from the weighted detection result and a preset threshold value, wherein the design information includes a first array information regarding a center part made up of pixels of a rectangular shape and pixels of a non-rectangular shape arranged around the center part in a display area of a non-rectangular shape.