发明名称 Signal test apparatus for SAS devices
摘要 A signal test apparatus for a serial attached Small Computer System Interface (SAS) device includes an SAS female connector to be connected to the SAS device, an SAS male connector to be connected to a server, first and second pairs of subminiature version A (SMA) connectors, and first and second groups of switches. When the first pair of SMA connectors is connected to an oscillograph to test a pair of output signals from the SAS device, the second group of switches are turned on and the first group of switches are turned off to communicate the SAS device with the server. When the second pair of SMA connector is connected to the oscillograph to test another pair of output signals from the SAS device, the first group of switches are turned on and the second group of switches are turned off to communicate the SAS device with the server.
申请公布号 US8760173(B2) 申请公布日期 2014.06.24
申请号 US201113221917 申请日期 2011.08.31
申请人 Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.;Hon Hai Precision Industry Co., Ltd. 发明人 Li Hui;Huang Fa-Sheng
分类号 G01R27/00;G01R1/00;H05K1/00;H05K1/16 主分类号 G01R27/00
代理机构 Novak Druce Connolly Bove + Quigg LLP 代理人 Novak Druce Connolly Bove + Quigg LLP
主权项 1. A signal test apparatus for a serial attached Small Computer System Interface (SAS) device, the signal test apparatus comprising: a test board; an SAS female connector mounted on the test board to be connected to the SAS device, the SAS female connector comprising a first group of ground pins, a first group of data receiving pins, a first group of data output pins, a second group of ground pins, a second group of data receiving pins, a second group of data output pins, and a first group of power pins; an SAS male connector mounted on the test board to be connected to a server, the SAS male connector comprising a third group of ground pins, a third group of data receiving pins, a third group of data output pins, a fourth group of ground pins, a fourth group of data receiving pins, a fourth group of data output pins, and a second group of power pins; first and second pairs of subminiature version A (SMA) connectors mounted on the test board; and first and second groups of switches; wherein the first group of power pins are connected to the second group of power pins, the first group of ground pins are connected to the third group of ground pins, the first group of data receiving pins are connected to the third group of data receiving pins, the second group of ground pins are connected to the fourth group of ground pins, the second group of data receiving pins are connected to the fourth group of data receiving pins, first terminals of the first group of data output pins are connected to the first pair of SMA connectors, second terminals of the first group of data output pins are connected to the third group of data output pins through the first group of switches, first terminals of the second group of data output pins are connected to the second pair of SMA connectors, second terminals of the second group of data output pins are connected to the third group of data output pins through the second group of switches; and wherein when the first pair of SMA connectors is connected to an oscillograph to test a pair of output signals from the SAS device, the second group of switches are turned on and the first group of switches are turned off to communicate the SAS device with the server; wherein when the second pair of SMA connectors is connected to the oscillograph to test another pair of output signals from the SAS device, the first group of switches are turned on and the second group of switches are turned off to communicate the SAS device with the server.
地址 Shenzhen CN