发明名称 Method and system for implementing circuit simulators
摘要 A system and method for performing circuit simulation is described. The present approach provides methods and systems that create reusable and independent measurements for use with circuit simulators. Also disclosed are parallelizable measurements having looping constructs that can be run without interference between parallel iterations. Reusability is enhanced by having parameterized measurements. Revisions and history of the operating parameters of circuit designs subject to simulation are tracked. Mechanisms are provided that allow for viewing, measurement or other manipulation of signals at specific locations in a circuit design for simulation, such as parameters that include observation points which are implemented using probes. One approach to executing a measurement is via a controllable and flexible control statement, which in one embodiment is the “run” statement. Improved interfaces for viewing, controlling, and manipulating simulations and simulation results are also provided.
申请公布号 US8762123(B2) 申请公布日期 2014.06.24
申请号 US201012914909 申请日期 2010.10.28
申请人 Cadence Design Systems, Inc. 发明人 Kundert Kenneth S.
分类号 G06F17/50;G06F7/60;G06F13/10;G06F11/26 主分类号 G06F17/50
代理机构 Vista IP Law Group, LLP 代理人 Vista IP Law Group, LLP
主权项 1. A computer implemented method for executing a measurement, comprising: using a computing system that comprises at least one processor and is to perform a process, the process comprising: receiving a statement to run a measurement for an electronic circuit design;determining whether multiple measurements are to be executed to run the measurement, in which the multiple measurements comprise at least one independent parameterized block for measuring one or more aspects of the electronic circuit design, and the at least one independent parameterized block specifies at least one parameterized stimulus as input and is associated with a dataset that is used to maintain independence of the at least one measurement;removing a first measurement from the multiple measurements based at least in part upon a previous value of a circuit parameter from a prior measurement;executing one or more measurements but not the first measurement of the multiple measurements for the measurement by using a loop processing and one or more resized arrays resized according to a total number of multiple iterates in the loop processing to perform independent parallel iterations of activities for the one or more measurements within an independent processing environment, which are created for each of multiple iterates in the loop processing, of multiple independent processing environments to simulate or emulate one or more activities of the electronic circuit design over a range of parameter values without using serial looping constructs, access to index variables, or reference to the index variables during the loop processing; andgenerating results for executing the one or more measurements by knitting individual results in the multiple independent processing environments to retain a hierarchical characteristic of the one or more measurements in the measurement.
地址 San Jose CA US