发明名称 Lithographic apparatus and surface cleaning method
摘要 An apparatus and method for cleaning a contaminated surface of a lithographic apparatus are provided. A liquid confinement structure comprises at least two openings used to supply and extract liquid to a gap below the structure. The direction of flow between the openings can be switched. Liquid may be supplied to the gap radially outward of an opening adapted for dual flow. Supply and extraction lines to respectively supply liquid to and extract liquid from the liquid confinement structure have an inner surface that is resistant to corrosion by an organic liquid. A corrosive cleaning fluid can be used to clean photo resist contamination.
申请公布号 US8760616(B2) 申请公布日期 2014.06.24
申请号 US201012956934 申请日期 2010.11.30
申请人 ASML Netherlands B.V. 发明人 Kaneko Takeshi;Hoekerd Kornelis Tijmen
分类号 G03B27/32;G03B27/42;G03B27/52;G03F7/20 主分类号 G03B27/32
代理机构 Pillsbury Winthrop Shaw Pittman LLP 代理人 Pillsbury Winthrop Shaw Pittman LLP
主权项 1. A lithographic apparatus comprising: a fluid handling system configured to confine immersion liquid to a space between a final element of a projection system and a substrate and/or a table, the fluid handling system comprising at least two openings configured to supply liquid to a gap between the fluid handling system and the substrate and/or the table and to extract liquid from the gap; and a controller configured to control the direction of liquid flow through the at least two openings during an exposure operation such that the at least two openings extract liquid from the gap and to control a direction of liquid flow through the at least two openings such that during a cleaning operation other than during exposure of the substrate using the projection system, the directions of liquid flow through at least two of the at least two openings are opposite.
地址 Veldhoven NL