发明名称 Implementing enhanced pseudo random pattern generators with hierarchical linear feedback shift registers (LFSRs)
摘要 A method and circuit for implementing enhanced Logic Built In Self Test (LBIST) diagnostics, and a design structure on which the subject circuit resides are provided. A plurality of pseudo random pattern generators (PRPGs) is provided, each PRPG comprising one or more linear feedback shift registers (LFSRs). Each respective PRPG includes an XOR feedback input selectively receiving a feedback from another PRPG and predefined inputs of the respective PRPG. A respective XOR spreading function is coupled to a plurality of outputs of each PRPG with predefined XOR spreading functions applying test pseudo random pattern inputs to LBIST channels for LBIST diagnostics.
申请公布号 US8762803(B2) 申请公布日期 2014.06.24
申请号 US201213353727 申请日期 2012.01.19
申请人 International Business Machines Corporation 发明人 Douskey Steven M.;Fitch Ryan A.;Hamilton Michael J.;Kaufer Amanda R.
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人 Pennington Joan
主权项 1. A method for implementing enhanced Logic Built In Self Test (LBIST) diagnostics comprising: providing a plurality of pseudo random pattern generators (PRPGs), each PRPG comprising one or more linear feedback shift registers (LFSRs); providing each respective PRPG with an Exclusive-Or (XOR) feedback input for selectively receiving a feedback coupled from another PRPG and predefined inputs of the respective PRPG; providing a respective XOR spreading function coupled to a plurality of outputs of each PRPG; and applying test pseudo random pattern inputs to LBIST channels for LBIST diagnostics with predefined XOR spreading functions; and providing a plurality of child Multiple Input Signature Registers (MISRs) collecting and compressing LBIST channel data.
地址 Armonk NY US