发明名称 |
Implementing enhanced pseudo random pattern generators with hierarchical linear feedback shift registers (LFSRs) |
摘要 |
A method and circuit for implementing enhanced Logic Built In Self Test (LBIST) diagnostics, and a design structure on which the subject circuit resides are provided. A plurality of pseudo random pattern generators (PRPGs) is provided, each PRPG comprising one or more linear feedback shift registers (LFSRs). Each respective PRPG includes an XOR feedback input selectively receiving a feedback from another PRPG and predefined inputs of the respective PRPG. A respective XOR spreading function is coupled to a plurality of outputs of each PRPG with predefined XOR spreading functions applying test pseudo random pattern inputs to LBIST channels for LBIST diagnostics. |
申请公布号 |
US8762803(B2) |
申请公布日期 |
2014.06.24 |
申请号 |
US201213353727 |
申请日期 |
2012.01.19 |
申请人 |
International Business Machines Corporation |
发明人 |
Douskey Steven M.;Fitch Ryan A.;Hamilton Michael J.;Kaufer Amanda R. |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
Pennington Joan |
主权项 |
1. A method for implementing enhanced Logic Built In Self Test (LBIST) diagnostics comprising:
providing a plurality of pseudo random pattern generators (PRPGs), each PRPG comprising one or more linear feedback shift registers (LFSRs); providing each respective PRPG with an Exclusive-Or (XOR) feedback input for selectively receiving a feedback coupled from another PRPG and predefined inputs of the respective PRPG; providing a respective XOR spreading function coupled to a plurality of outputs of each PRPG; and applying test pseudo random pattern inputs to LBIST channels for LBIST diagnostics with predefined XOR spreading functions; and providing a plurality of child Multiple Input Signature Registers (MISRs) collecting and compressing LBIST channel data.
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地址 |
Armonk NY US |